Tutorial on In Situ and Operando (Scanning) Transmission Electron Microscopy
Author Information
Author(s): Smeaton Michelle A., Abellan Patricia, Spurgeon Steven R., Unocic Raymond R., Jungjohann Katherine L.
Primary Institution: National Renewable Energy Laboratory
Conclusion
In situ and operando (S)TEM techniques provide powerful insights into nanoscale structure-property relationships but require careful experimental design to minimize artifacts and maximize data quality.
Supporting Evidence
- In situ and operando (S)TEM allows for real-time observation of material changes under various stimuli.
- Recent advancements in (S)TEM techniques have improved spatial and temporal resolution.
- Careful experimental design is crucial to minimize artifacts and ensure accurate data collection.
Takeaway
This tutorial teaches how to use special microscopes to see tiny things while they change, like how materials behave under different conditions.
Methodology
The tutorial discusses the design and execution of in situ and operando (S)TEM experiments, focusing on sample preparation, data acquisition, and analysis techniques.
Potential Biases
Potential biases may arise from the electron beam's interaction with the sample, which can alter the material's properties during observation.
Limitations
The complexity of in situ and operando experiments can lead to challenges in replicating native conditions and may introduce artifacts.
Digital Object Identifier (DOI)
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