Using Reflection Polarized Optical Microscopy to Compare Crystallinity in Thin Films
Author Information
Author(s): Rawan A. Alzahrani, Nisreen Alshehri, Alaa A. Alessa, Doha A. Amer, Oleksandr Matiash, Catherine S. P. De Castro, Shahidul Alam, José P. Jurado, Julien Gorenflot, Frédéric Laquai, Christopher E. Petoukhoff
Primary Institution: King Abdullah University of Science and Technology (KAUST)
Hypothesis
Can reflection polarized optical microscopy (POM) effectively evaluate the crystallinity and phase segregation of P3HT:PCBM thin films?
Conclusion
Reflection POM is a rapid, nondestructive tool that can effectively evaluate the crystallinity and phase segregation of organic semiconductor thin films.
Supporting Evidence
- Reflection POM provides 3× greater contrast than transmission POM.
- The contrast in POM images correlates directly with the degree of polymer crystallinity.
- Bright and dark domains in POM images arise from symmetry-broken liquid crystalline phases.
- Reflection POM can be integrated into automated device fabrication facilities for rapid diagnostics.
Takeaway
This study shows that a special type of microscope can help scientists quickly see how organized the materials are in thin films used for electronics.
Methodology
The study employed reflection polarized optical microscopy with Köhler illumination and slightly uncrossed polarizers to evaluate thin films.
Limitations
The study primarily focused on P3HT:PCBM films and may not generalize to all organic semiconductors.
Digital Object Identifier (DOI)
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