The Role of the Cantilever in Kelvin Probe Force Microscopy Measurements
Author Information
Author(s): Elias George, Glatzel Thilo, Meyer Ernst, Schwarzman Alex, Boag Amir, Rosenwaks Yossi
Primary Institution: Tel-Aviv University
Hypothesis
What is the effect of the cantilever on the measurements in Kelvin probe force microscopy?
Conclusion
The cantilever significantly influences the absolute contact potential difference measured in Kelvin probe force microscopy, even though it has a minimal effect on measurement resolution.
Supporting Evidence
- The cantilever has a strong effect on the measured contact potential difference.
- The cantilever's influence on measurement resolution is relatively small.
- Ignoring the cantilever can lead to a significant underestimation of the absolute CPD value.
Takeaway
The cantilever in a special microscope affects how we measure tiny electrical differences, and ignoring it can lead to big mistakes in our results.
Methodology
The boundary element method was used to calculate the point spread function of the measuring probe, including the cantilever.
Limitations
The model does not include signal-to-noise considerations, which may affect measurement resolution.
Digital Object Identifier (DOI)
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