Protonation-Driven Polarization Retention Failure in Lead-Free Ferroelectric Thin Films
Author Information
Author(s): Sheeraz Muhammad, Ahn Chang Won, Duong Nguyen Xuan, Hwang Soo-Yoon, Jang Ji-Soo, Kim Eun-Young, Kim Yoon Ki, Lee Jaeyeong, Jin Jong Sung, Bae Jong-Seong, Lee Myang Hwan, Han Hyoung-Su, Kim Gi-Yeop, Cho Shinuk, Song Tae Kwon, Yang Sang Mo, Bu Sang Don, Baek Seung-Hyub, Choi Si-Young, Kim Ill Won, Kim Tae Heon
Primary Institution: University of Ulsan
Hypothesis
Protonation driven by water dissociation causes polarization retention failure in lead-free ferroelectric (K,Na)NbO3 thin films.
Conclusion
The study found that humidity-induced protonation leads to polarization retention loss in nano-columnar (K,Na)NbO3 thin films.
Supporting Evidence
- The polarization retention loss in nano-columnar (K,Na)NbO3 thin films is attributed to domain wall pinning by the accumulation of hydrogen ions.
- Protonation by water dissociation is responsible for the humidity-induced retention loss.
- Thicker KNN films with nanopillar structures are more vulnerable to humidity than thinner films.
Takeaway
When these special thin films are exposed to water in the air, they lose their ability to hold an electric charge because tiny hydrogen particles get in the way.
Methodology
Epitaxial growth of (K,Na)NbO3 films with varying thicknesses and analysis of their polarization retention properties under humidity conditions.
Limitations
The study primarily focuses on specific thicknesses of (K,Na)NbO3 films and their behavior under humidity, which may not represent all conditions.
Digital Object Identifier (DOI)
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